Scanning Electron Microscopy (SEM) Analysis Services

Scanning Electron Microscopy (SEM) provides detailed, high-resolution imaging of material surfaces to reveal morphology, topography, and microstructural features essential for research, failure analysis, and quality control. SEM uses a focused electron beam to generate secondary and backscattered electrons, enabling visualization of surface textures, particle distributions, fracture surfaces, and coatings. Infinita Lab offers expert SEM operation with various detectors and analytical capabilities including elemental mapping when paired with EDS. Our comprehensive SEM reports include images, annotations, and interpretation to support materials development, defect analysis, and advanced characterization needs.